CoE 197U Scaling
Contents
Moore's Law
In 1965, Gordon Moore published a 4-page paper entitled "Cramming more components onto integrated circuits"[1], where he predicted that the number of components in an integrated circuit will increase by a factor of two every year, as shown in Fig. 1. Note that he based his extrapolation on just 4 data points!
Why is this paper and the graph in Fig. 1 important? Gordon Moore's prediction, also known as Moore's Law, has reflected and, more importantly, driven the steady and rapid progress in computing technology[2]. Thus, satisfying Moore's Law has become the goal instead of being merely a prediction.
Evolution of Complexity
As Gordon Moore predicted, the cost and performance advantage of putting more and more devices into a single integrated circuit (IC) led to the rapid increase in circuit complexity. One convenient indicator of circuit complexity is the number of transistors contained in a single IC.
Challenges in Digital Design
Why Scale?
The Cost of Integrated Circuits
Non-Recurrent Engineering Costs
Recurrent Costs
Yield
References
- ↑ 1.0 1.1 Gordon E Moore, Cramming more components onto integrated circuits, Electronics, Volume 38, Number 8, April 19, 1965 (pdf)
- ↑ Gordon Moore: The Man Whose Name Means Progress, IEEE Spectrum, March 2015.
- ↑ Wikimedia
- ↑ S. E. Thompson, S. Parthasarathy, Moore's law: the future of Si microelectronics, Materials Today, Volume 9, Issue 6, 2006, Pages 20-25. (link)
- ↑ K. Rupp, 42 Years of Microprocessor Trend Data, https://www.karlrupp.net/2018/02/42-years-of-microprocessor-trend-data/
- ↑ B. Kunert, Integration and Application of Epitaxial Systems: III/V on Silicon for Optoelectronics, IMEC Belgium 2015
- ↑ W. Haensch et al., Silicon CMOS devices beyond scaling, IBM Journal of Research and Development, vol. 50, no. 4.5, pp. 339-361, July 2006, doi: 10.1147/rd.504.0339.
- ↑ ITRS, The International Technology Roadmap for Semiconductors (2004 edition), 2004. Technical Report, http://public.itrs.net
- ↑ S. Borkar, T. Karnik, S. Narendra, J. Tschanz, A. Keshavarzi and V. De, Parameter variations and impact on circuits and microarchitecture, Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451), Anaheim, CA, USA, 2003, pp. 338-342, doi: 10.1145/775832.775920.
- ↑ Chen (IBM), ISS Europe 2007, (link).
- ↑ BCA Research (link).