Difference between revisions of "CoE197U-A1.1"
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** Read Gordon Moore's 1965 paper. | ** Read Gordon Moore's 1965 paper. | ||
** Read a paper on CMOS scaling. | ** Read a paper on CMOS scaling. | ||
− | ** Read a paper on | + | ** Read a paper on process variability. |
** Write a short (1-page) report. | ** Write a short (1-page) report. | ||
* Should you have any questions, clarifications, or issues, please contact your instructor as soon as possible. | * Should you have any questions, clarifications, or issues, please contact your instructor as soon as possible. | ||
Line 33: | Line 33: | ||
=== Submission === | === Submission === | ||
− | Submit your report | + | Submit your report in UVLE. Make sure to submit it in your respective submission bins. Good luck! |
Latest revision as of 10:39, 15 February 2022
- Activity: IC Fabrication and Scaling
- Instructions: In this activity, you are tasked to
- Watch a short video about integrated circuit (IC) fabrication.
- Read Gordon Moore's 1965 paper.
- Read a paper on CMOS scaling.
- Read a paper on process variability.
- Write a short (1-page) report.
- Should you have any questions, clarifications, or issues, please contact your instructor as soon as possible.
- At the end of this activity, the student should be able to:
- Enumerate and explain the key steps and technologies involved in fabricating integrated circuits.
- Explain why there is a concern about the future of CMOS technology.
Video
- Video: Silicon Run I (1996) Youtube link
After watching the video, go over Phillip Allen's slides on CMOS fabrication. This is a good simplified overview of the modern IC fabrication process.
Paper/Article Reading
- Gordon E Moore, Cramming more components onto integrated circuits, Electronics, Volume 38, Number 8, April 19, 1965 (pdf)
- T. Skotnicki, J. A. Hutchby, Tsu-Jae King, H. -. P. Wong and F. Boeuf, The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance, in IEEE Circuits and Devices Magazine, vol. 21, no. 1, pp. 16-26, Jan.-Feb. 2005, doi: 10.1109/MCD.2005.1388765.
- S. Borkar, Designing reliable systems from unreliable components: the challenges of transistor variability and degradation, in IEEE Micro, vol. 25, no. 6, pp. 10-16, Nov.-Dec. 2005, doi: 10.1109/MM.2005.110.
- You can access this paper for free via the UPEEEI VPN service.
- IEEExplore link.
VPN Access
For questions on UPEEEI VPN access, please send an email to EEEI Support: @
Report Guide
Based on the video you watched, the papers (not limited to the papers above) you have read, and any other resource that is available to you, write a short (1-2 page) report on what you think would be the key challenges IC designers will face in the near future, and why.
Submission
Submit your report in UVLE. Make sure to submit it in your respective submission bins. Good luck!